Accelerated thermal ageing with the Arrhenius model
Inspite of ever more severe requirements on reliability and endurance of products, product life spans are decreasing. To receive information on weak spots and causes of failures at the earliest possible stage is therefore of high interest.
Tests on heating of components or increase of ambient temperatures can be performed using the Arrhenius model. This model is a procedure applied for accelerating the thermal ageing of electronic components. It can be used to simulate temperature-related ageing within the context of environmental testing.